Method of using strongly coupled components to estimate integrated circuit performance

ABSTRACT

A technique to verify, evaluate, and estimate the performance of an integrated circuit is embodied in a computer software program that is executable by a computer system. When estimating performance, the invention partitions an integrated circuit into strongly coupled components. The technique accurately estimates of the performance (e.g., transient delays) of an integrated circuit, and has fast execution times. The technique is applicable to small circuits having relatively few transistors, and especially well suited for integrated circuits having millions of transistors and components. The technique handles the effects of deep-submicron integrated circuit technology.

CROSS-REFERENCES TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.09/999,222, filed Oct. 24, 2001, now U.S. Pat. No. 6,851,095 which is adivision of U.S. patent application Ser. No. 09/357,940, filed Jul. 21,1999, issued Dec. 24, 2002 as U.S. Pat. No. 6,499,129, which claims thebenefit of U.S. provisional patent application 60/093,830, filed Jul.22, 1998. The above applications and all the references cited in thisapplication are incorporated by reference.

BACKGROUND OF THE INVENTION

The present invention relates to the field of electronic designautomation (EDA) software, and more specifically, to techniques ofverifying, evaluating, and estimating the performance of integratedcircuits.

Integrated circuit technology is a marvel of the modem age. Integratedcircuits are used in many applications such as computers, consumerelectronics, networking, and telecommunications. There are many types ofintegrated circuits including microprocessors, microcontrollers,application specific integrated circuits (ASICs), gate arrays,programmable logic devices (PLDs), field programmable gate arrays(FPGAs), dynamic random access memories (DRAMs), static random accessmemories (SRAMs), erasable programmable read only memories (EPROMs),electrically erasable programmable read only memories (EEPROMs), andFlash memories. Integrated circuits are also sometimes referred to as“chips.”

Integrated circuit technology continues to rapidly advance. Automationtools are needed to simplify and expedite the task of designing anintegrated circuit. It is important to be able to accurately predict orestimate the performance of an integrated circuit before the integratedcircuit is fabricated. Techniques are needed to provide accurate, fastestimates of the performance of an integrated circuit.

As semiconductor processing techniques continue to improve, theperformance of integrated circuits also continues to improve.Deep-submicron integrated circuit technology has enabled commercialmultimillion transistor commercial integrated circuits operating at, forexample, 500 megahertz. High clock frequencies require the ability toreliably analyze the performance of circuits with little tolerance forerror. A 10 percent tolerance in a performance estimate of a 500megahertz design equates to a margin of 200 picoseconds, which is 0.200nanoseconds. In other words, there is little room for error inperformance estimation.

In addition to accuracy, capacity, and speed are also importantconsiderations for any performance estimation technique. For example,time-to-market pressures demand performance analysis tools with theability to obtain an accurate snapshot of the performance of a10-million-transistor design within a day so that system architects canmake meaningful architectural tradeoffs without having to wait for daysto obtain an accurate result.

As can be seen, techniques are needed to predict and estimate theperformance of integrated circuits, especially fast and efficienttechniques that provide accurate results for integrated circuit designswith a large number of transistors.

SUMMARY OF THE INVENTION

The present invention provides a technique for the performanceverification, evaluation, and estimation of integrated circuits. Toestimate performance, the invention partitions an integrated circuitdesign into strongly coupled components. In an embodiment, the techniqueof the present invention is embodied in a computer software program thatis to be executed by a computer system. In particular, the techniquefacilitates accurate estimates of the performance (e.g., transientdelays) of an integrated circuit and has fast execution times. Althoughapplicable to small circuits having relatively few transistors, thetechnique is especially suited for integrated circuits having millionsof transistors and components.

The technology of the present invention is broadly applicable to custom,semicustom, and high-performance integrated circuits. The presentinvention may be used to accurately estimate the performance of all thepaths of an integrated circuit. When used in designs operating in the250 megahertz to 1 gigahertz range, and greater, the software of presentinvention can provide results within a design tolerance of about twopercent.

Further, the present invention handles the complexities of integratedcircuit technology, including deep-submicron effects. To achieve suchtight tolerances, the performance estimation technique handles thedeep-submicron effects of RC-interconnect and transistor interaction,cross-coupling capacitance, simultaneous-switching, and waveform shape.These effects are dynamic in nature and traditional techniques of statictransistor-level path analysis or library-based approaches cannotincorporate these dynamic effects. The present invention providessignificantly more accurate performance estimates for deep-submicrondesigns compared to other techniques such as static path analysis.

Since the present invention uses a dynamic simulation approach, it isable to incorporate cross-coupling capacitance, simultaneous-switching,and waveform shape effects with results that are comparable toSpice-level simulation. The present invention also produces fewer falsepaths with resulting savings in designer time and effort. Adivide-and-conquer approach enables the present invention to deal withvery large designs, with turnaround times of under a day for10-million-transistor designs.

In an embodiment of the present invention, the performance of anintegrated circuit is estimated by partitioning a netlist into stronglycoupled components (SCCs). A plurality of vectors is generated for eachof the strongly coupled components. Strongly driven nodes are determinedfor each SCC. Vector pairs are sequenced and accurate simulation isperformed on each strongly coupled component. The result is an accurateestimate of the performance of the integrated circuit, covering all thepaths. Moreover, strongly coupled components and the simulation resultsobtained during a first execution of software of the present inventionare saved in a database. During subsequent executions, these savedstrongly coupled components and the simulation results are reused forthose strongly coupled components that are unchanged, savingconsiderable time.

Other aspects of the present invention include tighter integrationbetween timing analysis and characterization by including Booleaninformation and automatic elimination of global (block-level) falsepaths.

In an embodiment, the invention is a method of evaluating theperformance of an integrated circuit. A netlist or circuit descriptionis partitioned into strongly coupled components. A number of vectors isgenerated for the strongly coupled components. The strongly driven nodesare determined. Stimulus is generated for the strongly coupledcomponents. A strongly coupled component includes a firstchannel-connected component and a second channel-connected component.The first channel-connected component influences a Boolean output of thesecond channel-connected component, and the second channel-connectedcomponent influences a Boolean output of the first channel connectedcomponent. A strongly driven node includes a logical element driving thenode with a drive strength greater than another logical element drivingthe same node.

In another embodiment, the invention is a computer program productincluding a computer usable medium with computer readable code forcausing an evaluation of the performance of an integrated circuit. Thecomputer program product includes computer readable code devicesconfigured to cause a computer to effect partitioning a netlist intostrongly coupled components; computer readable code devices configuredto cause a computer to effect generating a plurality of vectors for thestrongly coupled components; and computer readable code devicesconfigured to cause a computer to effect determining strongly drivennodes.

The invention is further a method of estimating the performance of anintegrated circuit design including selecting a circuit block of theintegrated circuit design. The circuit block may be described in a Spiceor netlist format. A logic function is obtained for a node of thecircuit block. In a specific embodiment, the logic function includesfour subfunctions fO, f1, f0′, and f1′. Using the logic function, a setof vectors is determined that switch or transition the logic function atthe node. A table is formed including the set of vectors.

In a further embodiment, the invention is a method of estimating theperformance of an integrated circuit design including making a firstestimation of the performance of the integrated circuit design. Duringthe first estimation of the performance of the integrated circuitdesign, a database is created to store estimated performance results forthe integrated circuit design. A second estimation of the performance ofthe integrated circuit design is made. During the second estimation ofthe performance of the integrated circuit design, the database is read.The stored estimated performance results from the database of at least aportion of the integrated circuit design are used, where the performanceresults for the portion of the integrated circuit design was estimatedduring the first estimation.

The invention includes a method of estimating the performance of anintegrated circuit design including selecting a circuit block of theintegrated circuit design. A logic function for a node of the circuitblock is obtained. Using the logic function, a set of vectors isdetermined that will switch the logic function at the node. A tableincluding the set of vectors is formed.

The invention includes a method of estimating the performance of anintegrated circuit design including dividing the integrated circuitdesign into channel-connected components, where a channel-connectedcomponent includes nodes and transistors reachable by tracingsource-drain connections of the transistors. Channel-connectedcomponents are identified that are connected in a feedback loop, where afeedback loop of channel-connected components includes an output of afirst channel-connected component driving an input of a secondchannel-connected component and an output of the secondchannel-connected component driving an input of the firstchannel-connected component. Channel-connected components connected in afeedback loop are merged together to form first strongly coupledcomponents.

Other objects, features, and advantages of the present invention willbecome apparent upon consideration of the following detailed descriptionand the accompanying drawings, in which like reference designationsrepresent like features throughout the figures.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a system of the present invention of estimating theperformance of an integrated circuit.

FIG. 2 shows a system block diagram of a computer system used to executethe software of the present invention.

FIG. 3 shows a flow diagram for the design of an integrated circuit.

FIG. 4A shows a flow diagram of a technique of performance estimation ofthe invention.

FIG. 4B shows a more detailed flow diagram of the technique ofperformance estimation of the invention.

FIG. 5 shows a channel-coupled circuit.

FIG. 6 shows another channel-coupled circuit.

FIG. 7 shows a strongly coupled circuit.

FIG. 8 shows another strongly coupled circuit.

FIG. 9 shows a multiplexer circuit as an example of a strongly coupledcomponent.

FIG. 10 shows a circuit description partitioned into strongly coupledcomponents.

FIG. 11 shows a waveform represented using a set of coefficients.

FIG. 12 shows a multiplexer circuit with output functions that can behandled using don't care expansion.

FIG. 13 shows a strongly coupled circuit where logic functions are to bedetermined at a node of the circuit.

DETAILED DESCRIPTION

FIG. 1 shows a system of the present invention for estimating theperformance of an integrated circuit. FIG. 1 may comprise a computer ordigital system used to execute the software of the present invention.For example, the method of the present invention may be performed usinga computer workstation. FIG. 1 shows a computer system 1 that includes amonitor 3, screen 5, cabinet 7, keyboard 9, and mouse 11. Mouse 11 mayhave one or more buttons such as mouse buttons 13. Cabinet 7 housesfamiliar computer components, some of which are not shown, such as aprocessor, memory, mass storage devices 17, and the like. Mass storagedevices 17 may include mass disk drives, floppy disks, Iomega® ZIP™disks, magnetic disks, fixed disks, hard disks, CD-ROMs, recordable CDs,DVDs, tape storage, reader, and other similar media, and combinations ofthese. A binary, machine-executable version, of the software of thepresent invention may be stored or reside on mass storage devices 17.Furthermore, the source code of the software of the present inventionmay also be stored or reside on mass storage devices 17 (e.g., magneticdisk, tape, or CD-ROM).

FIG. 2 shows a system block diagram of computer system 1 used to executethe software of the present invention. As in FIG. 1, computer system 1includes monitor 3, keyboard 9, and mass storage devices 17. Computersystem 1 further includes subsystems such as central processor 102,system memory 104, input/output (I/O) controller 106, display adapter108, serial port 112, network interface 118, and speaker 120. Theinvention may also be use with computer systems with additional or fewersubsystems. For example, a computer system could include more than oneprocessor 102 (i.e., a multiprocessor system) or a system may include acache memory.

Arrows such as 122 represent the system bus architecture of computersystem 1. However, these arrows are illustrative of any interconnectionscheme serving to link the subsystems. For example, speaker 120 could beconnected to the other subsystems through a port or have an internaldirect connection to central processor 102. Computer system 1 shown inFIG. 2 is but an example of a computer system suitable for use with thepresent invention. Other configurations of subsystems suitable for usewith the present invention will be readily apparent to one of ordinaryskill in the art.

A system including a computer or other programmed machine executingelectronic design automation (EDA) software is used in the design ofintegrated circuits. EDA software tools include schematic editors,performance estimation software, circuit simulators, layout editors,design rule checkers, parasitic extractors, and many others. In apreferred embodiment, the techniques of the present invention areimplemented in an EDA software program and executed on a computer. Thesoftware of the present invention provides performance estimation andverification of integrated circuits. The software may be stored on amass storage device such as a disk drive or other computer readablemedium, and then loaded (partially or entirely) into the memory of thecomputer for execution.

FIG. 3 shows a design flow for the design of an integrated circuit. Thisprocess may be used to design of a deep-submicron integrated circuit. Instep 303, the design of circuitry and logic gates for the integratedcircuit is defined. A circuit or logic design engineer defines theintegrated circuit by inputting a schematic, specifying the logic usinga high level design language (e.g., VHDL or Verilog), or otherwisesynthesizing the logic. The result is a netlist file containingcomponents and connections between the components. Interconnectionsbetween the components are referred to as nets. The netlist file canalso be used to estimate performance of the circuitry and verify properfunctionality of the logic. For example, a Spice file can be createdfrom the netlist. A circuit simulator such as Spice uses the Spice fileto estimate the timing of the circuity.

In step 308, a layout for the integrated circuit is created. The layoutcan be manually generated or automatically generated. The layout istypically contained in a database file such as a GDSII format file. Thelayout contains polygons and geometries on various layers that are usedto generate the mask set for fabricating the integrated circuit. In step312, parasitic and other parameters affecting circuit performance areextracted from the layout. Before the layout is prepared, the designengineer cannot be certain of what the parasitic capacitance andresistance the nets will be. Using the layout, the lengths, widths,area, and sizes of various circuit paths are measured. The capacitanceand resistance parameters for a process technology are defined in atechnology model file. Using these process parameters and the circuitpath information, the parasitic capacitances and resistances arecalculated. Parasitic capacitance and resistance creates propagationdelays based on resistance-capacitance (RC) delay.

In step 317, the parasitic capacitances and resistances are put into thenetlist or Spice file. This approach is referred to as backannotatingthe parasitics into the simulation file. The circuit simulator analyzesand estimates the performance of the circuitry with the parasiticresistance and capacitance information. In step 320, the design engineerlooks at the performance estimates to see whether they meet theperformance targets. If not, the design engineer may need to makechanges to the circuit or logic design or layout. If the performancetargets are met, the integrated circuit design can be fabricated.

Although the techniques may be applied with any process technology, inan embodiment, the invention specifically handles CMOS technology. CMOStechnology makes use of PMOS and NMOS transistors. A MOS transistor hasdrain, gate, source, and substrate or well connections. A size of a MOStransistor is defined by its gate width (W) and channel length (L). Theprinciples of the invention are applicable to designs using technologiesother than MOS transistor technology by analogy. For example, an NMOStransistor has a source and a drain which are analogous to the collectorand emitter of a npn bipolar transistor.

Some factors to consider when designing integrated circuit is that withadvances in process technology, integrated circuits continue to becomesmaller and faster. Channel lengths of transistors are much less thanone micron. In fact, integrated circuits are being designed withtransistors having channel lengths in the range from about 0.18 micronsto 0.35 microns. And, in the future, transistors will undoubtedly haveeven shorter channel lengths. The channel length is also referred to as“L effective” or Leff. The characteristics and performance ofshort-channel-length transistors are governed in part by what are knownas short channel effects. For long channel length transistors such asthose with channel lengths greater than one micron, the short channeleffects are largely negligible compared to the basic transistorcharacteristics. However, for short channel transistors, the shortchannel effects are significant and become more of a dominant factor inthe performance. Short channel effects are modeled using somewhatcomplex equations, and consideration of short channel effects generallyrequires more computing time.

As process technology advances, integrated circuits generally becomesmaller. More transistors and circuits are being placed on a singlechip. Consequently, there are a greater number of circuit paths withinthe integrated circuit for which the performance needs to be considered.And, to make the task more complicated, some of the paths may bedependent on other paths. To estimate the performance of the integratedcircuit, each of the various paths needs to be identified and analyzed.The performance of these circuit paths are compared against the targetof expected performance for the integrated circuit. As the number ofcircuit paths increase, there will be more paths to check, and this willincrease the computing time.

A typical integrated circuit system can be divided into a number offunctional blocks ranging in size from about 50,000 to over 500,000transistors. During the initial phases of the design process, integratedcircuit designers create functional blocks with estimated resistive andcapacitive interconnect models. Later on in the design cycle, accuratenetlists for the functional blocks may be extracted from layoutgeometry. Extracted netlists are typically very large. For example, a500,000-transistor design may contain from 3 million to 5 milliondevices (including MOSFETs, resistors, and capacitors) after extraction.

Therefore, when designing a modern integrated circuit, it is importantto consider short-channel or deep-submicron transistor effects andinterconnect behaviors to obtain an accurate performance estimate. It isimportant to consider all the critical circuit and performance paths.And, it is important that these performance estimates be doneefficiently to minimize processing time of the system.

FIG. 4A shows a flow diagram for a technique of the invention toestimate the performance of an integrated circuit. An example ofcomputer software that may be used to perform performance estimation ofintegrated circuits is the DynaBlock™ software. A source code listing inthe C++ programming language is provided in the microfiche appendix.Other examples of performance estimation software include DynaCore™,DynaRAM™, and DynaCell™. The technique of the present invention includesareas from logic minimization to automated test pattern generation(ATPG), switch-level analysis simulation, and graph isomorphism.

In step 404, the invention takes as input either a prelayout orextracted netlist for a design. The input also includes boundaryinformation such as inputs, outputs, clocks, input arrival time windows,and output required time windows and clock timing information.Additionally, the user can specify input waveform information, such asrise and fall slew rates, and second-order rate of change of slewinformation. This second-order information allows the tool to model theinput waveform very accurately. Since the input waveform may affect theperformance of the integrated circuit, the user can specify the inputwaveform and evaluate its effect on performance.

In step 409, the netlist is partitioned into strongly coupled components(SCCs), which are fundamental units of analysis. One SCC may also bereferred to as one partition. Strongly coupled components typicallyrange in size from, for example, 5 to 2000 transistors. Strongly coupledcomponents are analyzed in level order, and logic functions are derivedfor the outputs of the strongly coupled components including the effectof charging and discharging times. Strongly coupled components are thenclassified as combinational or state holding. The logic functions arerepresented using a modification of ordered-binary-decision diagrams(OBDDs).

In step 414, the logic functions are used derive a set of sensitizingvectors for each SCC output. During the sensitization process, greatcare is taken to generate true vectors that do not cause a conflict orexercise “sneak” paths. A conflict occurs when there are simultaneouscharging and discharging paths in the SCC. Conflicting or false pathscause problems during simulation because they lead spurious (usuallyhigh) delay results. The result of the sensitization process is a set ofvectors for the slowest and fastest input sequences for each output of astrongly coupled component, taking into account the state-dependentbehavior of the SCC.

The sensitization process may generate a large number of vectors,especially for strongly coupled circuits such as barrel shifters andwide multiplexers. A two-level logic minimization algorithm is utilizedto reduce the vector set. The minimization algorithm models the delay ofa term to obtain a reduced set of delay vectors.

Subsequently, in step 419, waveform stimulus is generated for thestrongly coupled components taking into account the arrival time windowsat a strongly coupled component. Each strongly coupled component issimulated in level order. Input waveforms are modeled using athree-coefficient piecewise linear function.

In step 424, the user simulates the circuitry. The technique of theinvention allows the user to choose among different simulationtechniques providing the designer trade off between run time andaccuracy. For example, some of the simulation techniques the user canchoose include the high performance simulation technique of theinvention, commercially available Spice software, and commerciallyavailable piecewise linear simulation. The simulation is performed“in-place,” to preserve the exact driver and load information for thestrongly coupled component.

The simulation technique of the invention performs output data reductionand circuit equation reduction to speed up simulation and reduce memoryconsumption without sacrificing accuracy. A two-terminal capacitormodel, such as a BSIM3 version 3 capacitor model, is used to speed upsimulation of load devices. The BSIM user's guide is incorporated byreference.

Output delays and output waveform shape coefficients are derived fromthe simulation and this information is passed to the next stronglycoupled component in level order. Since dynamic simulation is utilizedduring the delay calculation process, the present invention permits theaccurate modeling of the effects of coupling capacitance,simultaneous-switching, and waveform shape.

A technique of the invention is to maintain a database 431 of stronglycoupled components and their associated characterization informationduring its operation. Using this technique reduces the execution time ofthe software. Before a strongly coupled component is simulated, adatabase search is performed to identify a match based upon topology,load and input arrival, and slew. If a match is found in the database,simulation can be avoided completely. For data-path circuits such asadders, multipliers, and comparators, the time saved using this methodcan be enormous. When a run is completed, the database is stored ondisk. Subsequent reruns of the software can utilize the information inthe database. For example, during the design phase, as the designermakes modifications to the design and reruns the software, only thestrongly coupled components that were not matched in the database areresimulated. This incremental recharacterization feature enablescompleting performance verification of multimillion-transistor designsquickly.

FIG. 4B shows a more detailed diagram of the flow of the invention. Thesteps in the flow are clock network analysis 451, partition into SCCs454, check each SCC for match in the model database 457, functiongeneration and state point identification 460, strong nodeidentification 464, don't care expansion 467, vector generation 469,waveform or stimulus generation 472, simulation 475, and modelgeneration 477. More detail about these steps are provided in the sourcecode appendix and are also discussed below. Steps 451, 454, 457, 460,and 464 are portions of circuit partitioning 409. Steps 467 and 469 areportions of binary vector generation 414.

Circuit Partitioning

In the invention, circuit partitioning is performed using a divide andconquer approach where the circuitry is broken into smaller groupings ofcircuit elements. These groupings of circuit elements are calledstrongly coupled components or SCCs. The partitioned circuit elementsare analyzed and evaluated. The results of the analysis of thesepartitioned circuit elements are combined to determine the total resultfor the entire circuit block or integrated circuit. Depending on how thecircuit elements are partitioned, the analysis will be performed moreefficiently and accurately. A technique of the invention will partitiona circuit description containing transistors, interconnect resistors,interwire coupling capacitors, grounded capacitors, and other activecomponents. The method includes the steps of initial grouping ofcircuits by clock network analysis, tight coupling analysis, andstate-point identification.

Clock Network Analysis

To estimate the performance of an integrated circuit, the clock networkis identified. Knowing all the clock nets permits identification ofstate-holding subcircuits and permits setup and hold checks to beperformed on clocked logic such as latches and footed and footlessdomino logic. It also enables setup and hold timing verification checksto be performed on primary outputs. Previous methods for tracing theclock tree involve looking for topological matches for inverters,buffers, and other gates along the clock tree. A major drawback of thesetechniques is that if the user changes the topology, the clock tree isno longer recognized and timing analysis is inhibited.

In the invention, starting from the user-identified clock startingpoints, the clock network is traced by Boolean analysis. From eachuser-defined clock starting point, a forward trace is performed. Theforward trace identifies the channel-connected components (CCCs)connected to the clock starting point. A channel-connected component isdefined to be the set of nodes and attached transistors that arestrongly reachable by tracing or following source-drain connections. Inthe invention, this definition includes reachability through resistorsand also includes any capacitors connected to the nodes that are in thechannel-connected component. How CCCs are found is discussed below.

A Boolean logic function is obtained for each of the outputs of the CCC.Subsequently, a Boolean test is applied to each output of the CCC todetermine whether the clock signal propagates to the output or not. Ifthe clock signal propagates to an output, the forward trace is repeatedon the output. Because the clock network is identified by Booleananalysis, even if there are later topological changes in the clocknetwork, the clock tree will still be recognized because it has beenrepresented functionally.

The clock input to the CCC to be analyzed is called c. A complement ofthe clock signal is denoted by c or c′. The function of the output to betested is denoted by ƒ. First, the terms of ƒ that depend on the clock care identified by calculating the following expression:ƒ_(c⊕ c) =(ƒ_(c)⊕ƒ _(c) )

ƒ

The subscript denotes the cofactor operation. In order for the output tobe a clock signal, the output depends on c and will be either positiveunate or negative unate with respect to c. Therefore the test is:(ƒ_(c⊕ c) |_(c)≠0

ƒ_(c⊕ c) | c|=0)

(ƒ_(c⊕ c) |_(c)=0

ƒ_(c⊕ c) | _(c) ≠0)

TABLE 1 Clock Network Analysis 1. Start from a user specified clock netc. 2. Identify all CCCs connected to the clock net c. 3. Calculate thelogic functions for each output of each CCC connected to the clock net.4. For each output of each CCC connected to the clock net, test if theoutput depends on c and is either positive unate or negative unate withrespect to c. An output is considered positive unate with respect to cif changing c from 0 to 1 (while keeping other inputs constant) alwayscauses the output to either remain unchanged, OR, change from 0 to 1. Anoutput is considered negative unate with respect to c if changing c from0 to 1 (while keeping other inputs constant) always causes the output toeither remain unchanged, OR, change from 1 to 0. 5. Mark each unateoutput as a clock net. For each unate output, repeat the clock networkanalysis above, until all nodes are examined.

Tight Coupling Analysis

Tight coupling analysis is a technique of identifying circuit structuresthat behave as a single logical unit. For partitioning of a circuit withMOS transistors, a channel-connected component or CCC is defined to bethe set of nodes and attached transistors that are strongly reachable bytracing or following source-drain connections. In the invention, thisdefinition includes reachability through resistors, and also includesany capacitors connected to the nodes that are in the channel-connectedcomponent. A first step in partitioning is to group the circuit intochannel-connected components.

FIG. 5 shows a standard CMOS inverter 505. This is an example of achannel-connected component. Transistors 510 and 515 of the inverter arechannel-connected components. A signal can be traced from the drain tosource of transistor 510 to the drain to source of transistor 515.

FIG. 6 shows another example of a channel-connected component. Alltransistors including those used to create inverter 610, and transistor630 are channel connected. Transistor 625 is connected to the gate ofinverter 610 and is not part of the CCC of inverter 610 and transistor630.

The behavior of a channel-connected component however cannot always beanalyzed in isolation. Some circuits have feedback paths. The presenceof feedback and interaction between channel-connected components canresult in a combined behavior that is significantly different from thebehavior of individual components. For example, large couplingcapacitors between two channel-connected components can alsosignificantly alter the timing behavior of the circuit.

The present invention analyzes the circuit for strong interactionbetween the components using graph traversal techniques.Channel-connected components are grouped into strongly coupledcomponents or SCCs. Subsequently, the nodes of a strongly coupledcomponent are classified as being an input, output, or internal. Inaddition to the traditional static CMOS circuits, examples of SCCsinclude footed and footless domino logic, differential cascode voltageswitch (DCVS) logic, and similar structures with feedback.

SCCs are formed from CCCs that have a two-way influence relationship. Inother words, if two CCCs are connected in a feedback loop they aremerged to form an SCC. FIG. 7 shows a circuit with two channel-connectedcomponents 730 and 735. In FIG. 7, both channel-connected components 730and 735 form a strongly coupled component 760 because the output ofcomponent 735 influences a Boolean output of component 730, and anoutput component 730 influences a Boolean output of component 735. TheseCCCs will be merged together to form an SCC 760.

Table 2 summarizes a flow for a technique of the invention forpartitioning a circuit description into strongly coupled components.

TABLE 2 Circuit Partitioning 1. Identify all the channel connectedcomponents in the circuit. A channel-connected component may be definedto be the set of nodes and attached transistors that are stronglyreachable by tracing or following source-drain connections. In theinvention, this definition includes reachability through resistors, andalso includes any capacitors connected to the nodes that are in thechannel-connected component. 2. Identify inputs and outputs of allchannel connected components: Gate terminals of transistors that are notdriven by any other source or drain from within the channel connectedcomponent are considered inputs. Nets that are connected to the gates oftransistors belonging to any other channel connected component areconsidered outputs. 3. While merging is still occurring: Identify pairsof channel connected components (CCC) that are connected in a feedbackloop. A pair of channel connected components CCC1 and CCC2 are in afeedback loop relationship if an output of CCC1 drives an input of CCC2,AND, an output of CCC2 drives an input of CCC1. Merge the transistors,capacitors and resistors of the two CCC (CCC1 and CCC2) to form an SCC.4. While merging is still occurring: Identify pairs of SCCs that areconnected in a feedback loop. A pair of strongly coupled components SCC1and SCC2 are in a feedback loop relationship if an output of SCC1 drivesan input of SCC2, AND, an output of SCC2 drives an input of SCC1. Mergethe transistors, capacitors, and resistors of the two SCCs (SCC1 andSCC2) to form SCC3.

In step 1 of table 2, the channel-connected components (CCCs) areidentified by tracing source-drain connections for transistors. In step2, the inputs and outputs are identified.

In step 3, the strongly connected components are identified from thesechannel-connected components. SCCs are formed from CCCs that have atwo-way influence relationship. In other words, if two CCCs areconnected in a feedback loop they are merged to form an SCC. FIG. 7shows an example of two CCCs with a feedback relationship. CCCs aremerged into a single SCC, such as SCC 760. SCCs will be considered andanalyzed as a single component.

In step 4, SCCs are examined to determine if additional merging ispossible. For example, SCCs generated from step 3 may have may haveadditional feedback or coupling and could be combined with other SCCs.In step 4, larger groups absorb smaller groups. This will grow theclusters to build bigger SCCs.

When the above technique is applied to the circuit in FIG. 8, in step 1,an inverter 820 and a transmission gate 825 will be identified as achannel-connected component 835. Inputs and outputs are identified instep 2. In step 3, CCC 835 will be combined with inverter 837 to form astrongly coupled component because both the input and the output of theinverter 837 drive the CCC identified in step 1. In other words, theinverter 837 is fundamental to the operation of the transmission gate soit will be combined with CCC 835 to form an SCC.

In an embodiment of the present invention, while identifying thestrongly coupled components in steps 3 and 4, the state points orstate-holding nodes are also identified too. State points are discussedbelow.

State-Point Identification

State-point identification is a process of identifying functionalcircuit structures that are capable of holding a binary state for aduration that is significantly longer than the circuit response time.Examples include, but are not limited to, sequential-type logiccircuits, latches, flip-flops, registers, and memory cells. One approachto identity these types of circuit elements is to use pattern matchingagainst a library of patterns to identify such structures. A drawback ofsuch an approach however is that the library needs to be constantlyupdated as circuit styles evolve. Additionally, pattern matching is slowand run times increase dramatically as the library size grows.

In an approach of the present invention for state-point identification,a Boolean logic function is derived for each output and storage node ofa strongly coupled component. The logic function for a node n consistsof four subfunctions:

F^(n)=(f0, f1, f0′, f1′)^(n). Some of these subfunctions may be emptyfunctions. The functions are generated by path traversal and arecompactly represented by OBDDs. For a node in a strongly coupledcomponent, function f0 denotes the Boolean condition (with respect tothe inputs of an SCC) under which the node has a path to a “0” (or adischarge path). Function f1 denotes the Boolean condition under whichthe node has a path to a “1” or a charging path. Function f0′ denotesthe condition under which a node has no discharging path. Function f1′is the condition under which the node has no charging path. Note thatcircuit topologies commonly occur for which f0′ may not equal thecomplement of f0.

After the circuit is divided into SCCs, the state holding nodes areidentified. A node within an SCC is defined as state holding if (a)there is an input vector that can charge the node to 0 or 1, andsubsequently an input vector can be applied such that the node isneither charged to 0 nor to 1 (which means the node is floating); and(b) the node is capable of holding a charge for a period of time that ismuch larger than the clock frequency of operation of the circuit.

In an embodiment of the invention, a Boolean test is applied todetermine if (a) is possible. The Boolean test is (f0 !=0 OR f1 !=0) AND(f0′ AND f1′). This equation states that a strongly coupled component isstate holding if there exists a combination of inputs that can eithercharge or discharge a node n, and there exists a combination of inputssuch that node n is neither charged nor discharged (holds state). Inorder to test for (b), a method of the invention calculates theeffective node capacitance based on commonly known criteria. If theeffective node capacitance is greater than a user specified threshold,the node is considered having passed criterion (b).

The response time of stateless strongly coupled components can becharacterized by applying a stimulus independent of a previous state. Onthe other hand, previous state information should be utilized to analyzestate-holding strongly coupled components.

Vector Generation

After the circuitry has been partitioned in SCCs, the performance ofeach of the SCCs or partitions is analyzed. FIG. 10 shows a diagram ofcircuitry which has been partitioned into a number of strongly coupledcomponents 1010, 1015, 1020, 1025, and 1030. The diagram also shows howthe strongly coupled components are connected to each other. Eachstrongly coupled component will be evaluated to determine itsperformance. The performance of the paths of the integrated circuit willbe calculated by adding together the performance results from theindividual SCCs along these paths.

Vector generation is the process of determining the inputs to eachstrongly coupled components which will be used to estimate theperformance of the components. A first step in vector generation is toobtain a Boolean function for each internal storage node and output of astrongly coupled component. A technique of the present invention is anextension an ordered-binary-decision-diagram-based or OBDD-basedapproach. An OBDD-based approach typically derives conditions for a nodeto be charged to a “1” state or a “0” state. In the present invention,however, four functions are derived for a node: (f0, f1, f0′, f1′)n .The functions are generated by path traversal and are compactlyrepresented by OBDDs. For a node in a strongly coupled component, f0denotes the Boolean condition (with respect to the inputs of an SCC)under which the node has a path to a “0” (or a discharge path).Subfunction f1 denotes the Boolean condition under which the node has apath to a “1” or a charging path. Subfunction f0′ denotes the conditionunder which a node has no discharging path. Subfunction f1′ is thecondition under which the node has no charging path. Note that circuittopologies commonly occur for which f0′ may not equal the complement off0. Using f0 and f1′ or f1 and f0′, the delay for the 0 to 1 or 1 to 0transition can be determined.

The OBDDs are used to generate tables for the four functions of eachoutput of the SCC, where each cube (or term) of the table represents avalid, nonconflicting input vector for the SCC. Table generation fromOBDDs can generate a very large number of cubes and is heuristicallylimited by a user-specified constant. For each possible pair of cubesrepresented by the transitions f0 to f1, f1 to f0, (f0′ AND f1′) to f1,and (f0′ AND f1′) to f0, the switching delay is estimated for eachoutput. The switching delay estimate is a function of the chargingcurrent along the switched path and the capacitance charged ordischarged by the switching functions. The cube pairs may be ordered byestimated switching delay. The switching delay can be estimated by usinga fast delay modeling technique such as described in A. Salz & M.Horowitz, IRSIM: An Incremental MOS Switch-Level Simulator, in Proc. ofthe Design Automation Conf. 173-78 (1989), which is incorporated byreference, or any circuit simulator specified by the user.

Table 3 shows an example of a transition delay table. Each row or linein the lists the performance results for inputs “abc” changing from thevector in the first column of the table to the vector in the secondcolumn of the table. Xs represent don't cares. The corresponding outputtransition is in the third column. The fourth column gives theperformance delay. The fifth column gives the switching capacitance.

TABLE 3 Transition Delay Table Inputs From Cube Inputs To Cube OutputSwitching abc abc Transition Delay Capacitance 0X1 11X 0 to 1 0.27 0.08pf X10 01X 0 to 1 0.27 0.05 pf 11X 0X1 1 to 0 0.23 0.07 pf 11X 000 0′AND 1′ to 1 0.22 0.07 pf 11X 0X1 0′ AND 1′ to 1 0.20 0.03 pf

A transition delay table is generated for each of the outputs of theSCCs. From each of the tables, some of the vectors are selected. In anembodiment, the k fastest and slowest transitions are selected, where kis a user-specified limit. A restricted form of multiple output cubeminimization is performed on the combined delay table of all output toreduce the number of vectors. This reduces simulation time.

Although the sample table shown is for transition delays, otherperformance characteristics or parameters may also be estimated usingthe invention. The performance characteristic of interest will be storedin the table. For example, the power characteristics (such as currentconsumption) may be the estimated parameter. Then the table may insteadbe referred to as a power consumption table.

The function of the SCC is expanded and stored in table format. Eachline in the table estimates the delay or other performancecharacteristic for a particular vector. The user selects how manyvectors to simulate. Simulating more vectors will take more simulationtime. The vectors may be ordered from worst to best delay times. Thesimulation is performed using a circuit simulator of the user's choiceand the output waveform from the circuitry simulator is captured andstored.

When storing the output waveform, a technique of the invention to reducethe amount of storage space used is by compressing the data. This isimportant for large integrated circuits where there are many SCCs. Eventhough memory capacity for computers is generally growing, it is stillimportant to conserve memory space because doing analysis on largeintegrated circuits will rapidly consume the available memory space.Also, efficient memory use will increase execution speed by making morememory available for other processes and reducing memory transfer times.One technique to compress the waveform data is using a piecewise linearmodel. A number of points in the waveform are stored. Then, straightlines will be drawn through these points to re-create the originalwaveform. Storing fewer points will result in greater compression, butthe waveform is stored in a potentially less precise form.

After the performance results for each of the SCCs is determined, theperformance for the various paths of the integrated circuit design isobtained by adding together the performance delays for the SCCs for thepaths. By comparing the total performance delay for the various paths,the worst best or case path can be determined. For some inputconditions, the integrated circuit design may exhibit performance thatis worse or better than for other input conditions. Since best case andworst case vectors are kept in the table, the best and worst caseperformance conditions and results can be determined.

In an embodiment, the invention is a method of estimating theperformance of an integrated circuit design including selecting acircuit block of the integrated circuit design. The circuit block may bedescribed in Spice, netlist, or another similar format. A logic functionis obtained for a node of the circuit block. In a specific embodiment,the logic function includes four Boolean subfunctions, f0, f1, f0′, andf1′, as described above. Using the logic function, a set of vectorsfound that will switch or transition the logic function at the node. Atable is formed which includes the set of vectors. The table willinclude the performance results.

To find the f0 or f1 functions, trace all the paths from the node to avoltage source. For f0, the voltage source will be ground or VSS, andfor f1, the voltage source will be VCC or VDD. For each of the paths,take the logical AND of the Boolean conditions that enable thetransistors to be turned on. Then, take the logical OR of the logicalANDs conditions just calculated. For example, referring to the circuitin FIG. 13, to determine function f1 for node 1305, there are two paths1307 and 1309 to VCC. The Boolean condition to turn on path 1307 are A*B(A and B are logically ANDed). The Boolean condition to turn path 1309on are C*D (C and D are logically ANDed). These Boolean conditions arelogically ORed to obtain f1=A*B+C*D. Function f1 represents the Booleanconditions under which node 1305 gets to a logical 1. The technique tofind f0 is. analogous and is obtained by tracing the paths to VSS. Forthe circuit in FIG. 13, f0=E. Function f0 is the condition for node 1305to be discharged or 0.

To find f0′ and f1′, the paths are traced from the node to a voltagesource. For f0′, the voltage source will be ground, and for f1′, thevoltage source will be VCC. For each of the paths, take the logical ORof the Boolean conditions that disables or turns off the transistorsalong that path. Then, take the logical AND of all the logical ORs justcalculated. To obtain f1′ for the circuit in FIG. 13, for path 1307, theBoolean condition will be A′+B′ (which will turn off path 1307 to VCC).For path 1309, the condition will C′+D′. The function for f1′ is(A′+B′)*(C′+D′), which represents the Boolean condition under whichthere is no charging path for node 1305. In an analogous fashion, thefunction f0′=E′ is determined. Function f0′ is the condition for node1305 under which there will not be a discharging path.

Strongly Driven Nodes

In a circuit description, some of the source-drain paths may be falsepaths. The function for these false paths should not be evaluated orsimulated. To avoid evaluating false paths, an exhaustive path searchapproach may be used for function computation. That technique exhibitsexponential complexity and fails on circuits such as wide shifters andpass-transistor topologies where it is needed most.

An approach of the present invention to resolving charge sharing andconflicts relies on finding “strongly-driven” nodes and has provenitself to work reliably on a large class of CMOS digital circuits. Lets(f) for a node n denote the strength of the weakest charging ordischarging path in the set of input vectors contained in f. S(f)denotes the strength of the strongest charging or discharging path inthe set of input vectors contained in f. A node n is defined as stronglydriven if it satisfies the following conditions:(∃F ^(s) ⊂F ^(n)|(ƒ₀ ^(s)= ƒ ₁ ^(s)))

(∃σ|s(F ^(S))>S(F ^(n) −F ^(s)))

This equation states that the function at the node n has a static (ƒ₀^(s)= ƒ ₁ ^(s)) subset that is stronger than any other subset of F^(n)at the node. In other words, a node is strongly driven if it is drivenby a static CMOS subcircuit and the drive strength of the static CMOSsubcircuit is greater than the drive strength of any other path throughthat node. Once a node is identified as strongly driven, the functionfor that node is set to the static subset Fs and sneak paths traversingthrough that node are suppressed.

FIG. 9 shows a multiplexer circuit. Input a is connected to inverter903, and input b is connected to inverter 907. A path 915 from theoutput of inverter 903 through transmission gates 917, 919, and 922 is afalse path. This is a false path because, although it is possible path,path 915 is not a path that will typically occur during the operation ofthe multiplexer. A technique of eliminating this false path is to assigndrive strengths to each of the static logic elements. The drivestrengths of the logic elements will be based on the W/L ratio of thedevices. A logic element is considered static if f0 is equal to f1′. Forexample, inverter 907 has a drive strength of 5, while inverter 903 hasa drive strength less than 5. Then, using the technique of theinvention, because inverter 905 driving node 925 has the greatest drivestrength, other logic elements such as inverter 903 will not bepermitted to drive through node 925. This will cut off and eliminatefalse path 915. By eliminating false paths, this speeds up the processof estimating the performance of the circuit.

Don't-Care Expansion

Don't-care expansion is a process of selecting vectors to avoidconflicts or improper logical outcomes. Don't-care expansion eliminatesvectors that cause false paths, which will speed up the performanceestimation process. In the binary domain, ƒ₀ and ƒ₁ for output y₀do notdepend on t₀ and t₁. Hence, the tables for y₀ will have don't cares inthe positions corresponding t₀ and t₁. During simulation however, properstimulus must be generated for t₀ and t₁. Setting t₀ and t₁ to a randomvalue such as “0” will cause a conflict or collision at y₁. In order toeliminate the possibility of collision when simulating an output y_(j)the technique of the invention accepts only those vectors that satisfythe following equation:

$\bigcup\limits_{i \neq j}\left( {\left( {f_{0}^{j}\bigwedge f_{1}^{\prime j}} \right)\bigvee\left( {f_{1}^{j}\bigwedge f_{0}^{\prime j}} \right)} \right)$

This equation states the space into which a don't care is expanded doesnot contain collisions, or invalid (floating) node states. Don't caresin a term are “expanded” (assigned a “0” or “1” value) in such as waythat the above equation continues to be satisfied.

For example, in FIG. 12, there is a logical function for with inputs a,b, s0, and s1 and outputs y0 and y1. In an embodiment of the invention,the logical functions are expressed in (or converted to) sum of productsformat. The Boolean equations are (yO)′=(a*s0*/s1)+(b*s1*/S0) and(y1)′=/b. Don't care expansion will determine legal values for themissing inputs, a, s0, and s1, for y1 that will avoid conflicts for y1.It is logically possible for input a to part of the function for y1.However, this is a false path. In the operation of the multiplexer,input a will not be part of the y1 output because inputs s0 and s1 willnot be asserted in such a way to permit this conflict. Therefore, usingthe technique of the invention, valid values for a, s0, and s1 areselected to prevent this conflict situation from occurring. For example,s1 will be a 0.

Stimulus Generation

Automatically generating the sequence of waveforms required to properlysimulate an SCC requires careful analysis, especially for complexclocked logic such as footed or footless domino logic, and latches orflip-flops. There are wide variations in design styles and requirements.For example, for footed domino logic, a common requirement is to timethe arrival of inputs well before the precharge cycle is complete. Thisrequirement however may not hold for domino circuitry that is connectedto primary inputs. For footless domino logic, a requirement is that thedata signals become inactive before that precharge starts. The stimulusgeneration algorithms of the invention take into account all of thesecomplexities while generating proper waveforms.

After obtaining an optimal vector sequence for a strongly coupledcomponent, input waveforms are generated for accurate simulation. Awaveform is represented by a set of coefficients as shown in FIG. 11.The waveform is stored in compressed form using a piecewise linearmodel. Points of the waveform at t0, t1, and t2 are stored, instead ofstoring the complete waveform. To reconstruct the waveform from thesepoints, straight lines are drawn between the points.

The coefficients for the inputs of an SCC are obtained from thewaveforms of the fan-in SCCs, or the primary inputs if the SCC is drivenby primary inputs. An SCC is simulated “in-place” with the actualdrivers and receiving transistors to obtain the most accurate delaymeasurements.

For stimulus generation, each SCC is identified as being a sequential ornonsequential (i.e., combinatorial) function. A sequential function isone that involves latches, flip flops, domino logic, and the like. Ifthe function is sequential, then a vector is applied to the SCC thatsets up the initial conditions. This is because for sequential functionsthe next logic state depends on the previous logic state.

Next, a vector is applied to the sequential or nonsequential SCC tocause its output to switch. The vectors are applied to the SCC as aninput waveform. This input waveform will be analogous to the outputwaveform of a previous SCC in the path. The waveform may be stored in acompressed format as discussed later. Then, the previous output waveformreconstructed from the compressed format and used as the input waveformfor the SCC.

Simulation

A large design will generally have a large number of SCCs which need tobe simulated quickly. In order to maintain high accuracy, in anembodiment, the invention performs complete Spice-level numericalsimulation utilizing industry-standard BSIM3 version 3.2 device models.In order to speed up the simulation without sacrificing accuracy, theinvention provides some improved simulation techniques.

One of the techniques of the invention is to use an output datareduction. The output voltages are stored only at the time points atwhich they cross threshold values. The threshold values are userselectable. Typically, the threshold values are selected to represent 10percent, 50 percent, and 90 percent levels of the supply voltage. Forexample, only the performance delays to achieve the 10 percent, 50percent, and 90 percent of the VDD or VCC voltage level will be stored.Since scalar values or quantities are stored, and not the entirewaveforms. This saves storage space. In this example, only three valuesare stored. In other embodiments, any number of performance values-maybe stored depending on the threshold values the user is interested in.This feature also speeds up the design characterization process andreduces the amount of data exchange operations.

Circuit performance quantities such as average, maximum, and minimumvoltage and current values, delays, and rise and fall times arecalculated during simulation. The simulator internally calculates andreturns scalar quantities rather than voltage and current waveform data.This feature speeds-up the design characterization process and reducesthe amount of data exchange operations.

Typically, the SCC submitted to simulation contains many load MOSFETsconnected to the component output pins. During simulation those loadBSIM3 version 3 MOSFETs are simulated using two-terminal capacitancemodels, instead of using transistor models. These models are fullycompatible with the general BSIM3 version 3 intrinsic capacitancemodels. This feature speeds-up the design characterization processsignificantly without loss of accuracy and reduces the memoryconsumption. Simulating using a capacitance model will generally befaster than using a transistor model.

The invention uses circuit equation reduction. The technique reduces thenumber of circuit equations by excluding certain unknown variables. Foreach DC voltage source of the circuit, its current and node voltage arecalculated explicitly using Kirchoff current and voltage laws ratherthan by including them into system of equations. The unknown variableelimination significantly reduces the sparse solver fill-in. Thisfeature further speeds-up the simulation process and reduces the memoryconsumption.

For each strongly coupled component, the present invention can generatea complex delay model (e.g., a look-up table or polynomial equation) bysimulating the SCC for a range of slew rates or for SCCs that driveprimary output, for a range of slew rates and loads. Alternatively, ifthe slew rates at the primary inputs and loads at primary outputs areknown a-priori, an exact instance-specific delay model can be generated.An exact model is applicable in aggressive custom design during thedesign process, where the environment of a block within a design is wellknown. The complex model is useful for intellectual property (IP) coresthat will be used in a wide variety of applications.

Folded Model Generation

The present invention maintains a database of previously simulated SCCs,along with input waveforms and simulation results. If the current SCC tobe simulated “matched” a previously stored SCC in the database,simulation can be avoided. Two SCCs are said to match if they haveidentical circuit topology, their input waveform coefficients are withinsome constant a of each other, their active device sizes or values(MOSFETs, resistors, and capacitors) are within some constant b of eachother and their output load device sizes or values are within someconstant c of each other.

The SCC database is stored and reused during subsequent runs of anyother design. Thus, if the software of the present invention is runtwice on the same design without any changes, simulation is completelyavoided. This increases the execution speed of the present invention.

In an embodiment, the method of estimating the performance of anintegrated circuit design includes making a first estimation of theperformance of the integrated circuit design. During the firstestimation of the performance of the integrated circuit design, adatabase is created to store estimated performance results for theintegrated circuit design. The database is typically stored on the disk.This is a persistent database that is accessible and may be reusedduring subsequent executions of the software. The type of informationthat can be stored and reused are simulation results, partitioninginformation, transient delays, slope information, or simulation data, orany combination of these. Slope information is the rate of outputwaveform rise or fall (i.e., dI/dt or dV/dt).

A second estimation of the performance of the integrated circuit designis made. During the second estimation of the performance of theintegrated circuit design, the database is read. The stored estimatedperformance results of at least a portion of the integrated circuitdesign are used, where the performance results for the portion of theintegrated circuit design was estimated during the first estimation.This avoids calculation of the performance results for the secondpartition.

In particular, when performing the second estimation, a partition or SCCand its stored estimated performance results were stored in the databaseduring the first estimation. A second partition is obtained during thesecond estimation of the performance of the integrated circuit design.The second partition is compared to the first partition. If the firstand second partitions match, then the stored estimated performanceresults for the first partition are used as the estimated performanceresults for the second partition. Calculation of the estimatedperformance results for the second partition is avoided, which speeds upthe performance estimation.

The first and second partitions are consider to match if there is atopological match. For example, the first and second partitions haveexactly the same circuit topology. Further, the input waveformcoefficients for the two partitions should be within a first constant ofeach other. The device sizes for transistors and other devices of thetwo partitions should be within a second constant of another. And, theoutput loads for the two devices should be within a third constant ofanother. These constants are tolerances the user sets to tell thesoftware how close the partitions need to be before they are consideredto match.

If the first and second partitions do not match, the performance of thesecond partition is estimated using the approach as described above. Theperformance results are stored in the database, where they may be reusedduring subsequent executions of the software.

This detailed description of the invention has been presented for thepurpose of illustration and description. It is not intended to beexhaustive or to limit the invention to the precise form described. Manymodifications and variations are possible in light of this detaileddescription. The embodiments were chosen and described in order to bestexplain the principles of the invention and its practical applications.Others skilled in the art will recognize that various modifications canbe made in order to best utilize and practice the invention for aparticular application. The scope of the invention is defined by thefollowing claims.

1. A method of estimating the performance of an integrated circuitdesign comprising: selecting a circuit block of the integrated circuitdesign; obtaining a logic function for a node of the circuit block;using the logic function, determining a set of vectors that switch thelogic function at the node; and forming a table including the set ofvectors, wherein the logic function comprises: a first functionrepresenting a first Boolean condition for the node to be a logical 0; asecond function representing a second Boolean condition for the node tobe a logical 1; and a third function representing a third Booleancondition for the node not to be a logical
 0. 2. The method of claim 1wherein the logic function further comprises: a fourth functionrepresenting a fourth Boolean condition for the node not to be alogical
 1. 3. The method of claim 2 wherein the fourth functionrepresents the fourth Boolean condition under which the node has nocharging path.
 4. The method of claim 3 wherein a method of finding thelogical function comprises: tracing a first path from the node to avoltage source; determining a fifth and sixth Boolean condition todisable first and second transistors along the first path; and takingthe logical OR of the fifth and sixth Boolean conditions as a firstresult.
 5. The method of claim 4 wherein the method of finding thelogical function further comprises: tracing a second path from the nodeto the voltage source; determining a seventh Boolean condition todisable a third transistor along the second path; taking the logical ANDof the seventh Boolean condition and the first result as a secondresult; and using the second result as the logical function.
 6. Themethod of claim 5 wherein the third transistor is a MOS transistor. 7.The method of claim 4 wherein the voltage source is VDD or VCC.
 8. Themethod of claim 1 wherein the third function represents the thirdBoolean condition under which the node has no discharging path.
 9. Themethod of claim 8 wherein a method of finding the logical functioncomprises: tracing a first path from the node to a voltage source;determining a second and third Boolean condition to disable first andsecond transistors along the first path; and taking the logical OR ofthe second and third Boolean conditions as a first result.
 10. Themethod of claim 9 wherein the method of finding the logical functionfurther comprises: tracing a second path from the node to the voltagesource; determining a fourth Boolean condition to disable a thirdtransistor along the second path; taking the logical AND of the fourthBoolean condition and the first result as a second result; and using thesecond result as the logical function.
 11. The method of claim 9 whereinthe voltage source is ground.
 12. The method of claim 9 wherein thefirst and second transistors are MOS transistors.
 13. The method ofclaim 1 wherein a method of finding the second function comprises:tracing a first path from the node to a voltage source; determining afourth and a fifth Boolean condition to enable first and secondtransistors along the first path; and taking the logical AND of thefourth and fifth Boolean conditions as a first result.
 14. The method ofclaim 13 wherein the method of finding the second function furthercomprises: tracing a second path from the node to the voltage source;determining a sixth Boolean condition to enable a third transistor alongthe second path; taking the logical OR of the sixth Boolean conditionand the first result as a second result; and using the second result asthe second function.
 15. The method of claim 13 wherein the voltagesource is a positive voltage.
 16. The method of claim 13 wherein thefirst and second transistors are MOSFETs.
 17. The method of claim 1further comprising: converting the logic function to sum of productsform.
 18. The method of claim 1 wherein obtaining a logic functioncomprises performing a don't care expansion to determine valid valuesfor a plurality of missing variables of the logic function to avoidconflict at the node.
 19. The method of claim 1 wherein for a firstvector, the logic function will output a first output state, and for asecond vector, the logic function will output a second output state,wherein the first and second output states are different logical states.20. The method of claim 1 wherein the table comprises: an entry with atleast two vectors that switch the logic function and an estimatedcircuit performance quantity associated with switching the logicfunction.
 21. The method of claim 20 wherein the circuit performancequantity is an estimated transient delay or power characteristic. 22.The method of claim 1 wherein the circuit block is specified in netlistformat.
 23. A method of estimating the performance of an integratedcircuit design comprising: selecting a circuit block of the integratedcircuit design; obtaining a logic function for a node of the circuitblock; using the logic function, determining a set of vectors thatswitch the logic function at the node; and forming a table including theset of vectors, wherein obtaining a logic function comprises: assigninga drive strength to elements driving the node; and finding a firstelement driving the node with the greatest drive strength.
 24. Themethod of claim 23 wherein the first element is a static logic circuit,and a first Boolean condition for the first element to output a logic 0is equivalent to an inverse of a second Boolean condition for the firstelement to output a logic
 1. 25. The method of claim 23 wherein drivestrength is based on W/L ratios of transistors of the elements.
 26. Themethod of claim 23 wherein the node is a strongly driven node, andfurther comprising: not allowing elements other than the first elementto drive through the strongly driven node.
 27. The method of claim 23wherein the circuit block is specified in netlist format.
 28. A methodof estimating the performance of an integrated circuit designcomprising: selecting a circuit block of the integrated circuit design;obtaining a logic function for a node of the circuit block; using thelogic function, determining a set of vectors that switch the logicfunction at the node; forming a table including the set of vectors; andsorting entries of the table based on an estimated performance parameterof each entry.
 29. A method of estimating the performance of anintegrated circuit design comprising: selecting a circuit block of theintegrated circuit design; obtaining a logic function for a node of thecircuit block; using the logic function, determining a set of vectorsthat switch the logic function at the node; forming a table includingthe set of vectors; identifying whether the circuit block contains asequential or nonsequential function; if the circuit block contains asequential function, applying a first vector to initially set up thecircuit block; and applying an input waveform based on a second vectorand a third vector to cause an output of the circuit block totransition.
 30. The method of claim 29 wherein the input waveform isconstructed using a set of stored coefficients.
 31. A computer programproduct stored on a computer-readable storage medium for estimating theperformance of an integrated circuit design comprising: code forselecting a circuit block of the integrated circuit design; code forobtaining a logic function for a node of the circuit block; code forusing the logic function, determining a set of vectors that switch thelogic function at the node; and code for forming a table including theset of vectors, wherein obtaining a logic function comprises: assigninga drive strength to elements driving the node; and finding a firstelement driving the node with the greatest drive strength.